Show simple item record

dc.contributor.authorHlubina, Petr
dc.contributor.authorLuňáček, Jiří
dc.contributor.authorCiprian, Dalibor
dc.contributor.authorChlebus, Radek
dc.date.accessioned2008-10-24T13:36:06Z
dc.date.available2008-10-24T13:36:06Z
dc.date.issued2008
dc.identifier.citationOpto-Electronics Review. 2008, vol. 16, no. 4, p. 439-443.en
dc.identifier.issn1230-3402
dc.identifier.issn1896-3757
dc.identifier.urihttp://hdl.handle.net/10084/68473
dc.description.abstractWe revealed that the phase function of a thin-film structure measured by a white-light spectral interferometric technique depends on the path length difference adjusted in a Michelson interferometer. This phenomenon is due to a dispersion error of a beam splitter cube, the effective thickness of which varies with the adjusted path length difference. A technique for eliminating the effect in measurement of the phase function is described. In a first step, the Michelson interferometer with same metallic mirrors is used to measure the effective thickness of the beam splitter cube as a function of the path length difference. In a second step, one of the mirrors of the interferometer is replaced by a thin-film structure and its phase function is measured for the same path length differences as those adjusted in the first step. In both steps, the phase is retrieved from the recorded spectral interferograms by using a windowed Fourier transform applied in the wavelength domain.en
dc.format.extent1786842 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherVersitaen
dc.relation.ispartofseriesOpto-Electronics Reviewen
dc.relation.urihttp://dx.doi.org/10.2478/s11772-008-0040-1en
dc.rights© 2008 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subjectspectral interferometryen
dc.subjectwhite-light sourceen
dc.subjectMichelson interferometeren
dc.subjectbeam splitter cubeen
dc.subjectdispersionen
dc.subjectBK7 glassen
dc.subjectphase retrievalen
dc.subjecteffective thicknessen
dc.titleDispersion error of a beam splitter cube in white-light spectral interferometryen
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.identifier.doi10.2478/s11772-008-0040-1
dc.identifier.wos000259577700014


Files in this item

This item appears in the following Collection(s)

Show simple item record

© 2008 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Except where otherwise noted, this item's license is described as © 2008 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.