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dc.contributor.authorWeiss, Zdeněk
dc.contributor.authorWyslych, Petr
dc.contributor.authorČapková, Pavla
dc.contributor.authorKřístková, Monika
dc.contributor.authorHavlová, Dagmar
dc.date.accessioned2006-11-07T09:28:54Z
dc.date.available2006-11-07T09:28:54Z
dc.date.issued2002
dc.identifier.citationInternational Conference on Engineering Education : ICEE 2001, Oslo/Bergen, Norway, August 6-10, 2001. Proceedings. 2002, p. 532-538. International journal of engineering education, vol. 18, no. 5.en
dc.identifier.isbn1-588-74-091-9
dc.identifier.issn0949-149X
dc.identifier.urihttp://hdl.handle.net/10084/57851
dc.language.isoenen
dc.publisherTempusen
dc.relation.ispartofseriesInternational Conference on Engineering Education : ICEE 2001, Oslo/Bergen, Norway, August 6-10, 2001. Proceedingsen
dc.relation.urihttp://www.ineer.org/Events/ICEE2001/Proceedings/papers/479.pdfen
dc.subjectatomic force microscopyen
dc.subjectcomputer modelingen
dc.subjectelectron microscopyen
dc.subjectPh.D. student courseen
dc.subjectX-ray diffractionen
dc.titleAnalysis of nanostructured materials - Ph.D. courseen
dc.typearticleen
dc.identifier.locationNení ve fondu ÚKen
dc.description.abstract-enThe Ph.D. student course includes four areas oriented on analytical training in the field of nano-scale materials. The first one is focused on the computer modeling of nano-structured systems using the molecular simulation in Cerius2 modeling environment, the second deals with nanoscale surface analysis using Atomic Force Microscopy, and the third brings advanced information about crystal structure analysis using single-crystal and powder X-ray diffraction methods. The last area is oriented on analysis of materials by electron microscopy techniques. The Ph.D. student analytical course includes both theory and applications (training) of individual analytical procedures for various nano-structured materials (for example, nanotubes, intercalated and grafted clays, graphite, silicon wafers, polymer/clay nano-composites, and metalic thin multilayer materials).en
dc.identifier.wos000179181200009


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