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Characterization of organic low-dielectric-constant materials using optical spectroscopy
(Optics Express. 2001, vol. 9, issue 3, p. 141-151.)
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AuthorNakano, T. (1)Postava, Kamil (1)
Yamaguchi, Tomuo (1)
Date Issued2001 (1)Subjectellipsometry and polarimetry (1)
materials (1)
optical properties (1)organic materials (1)
physical optics (1)
Spectroscopy (1)
thin films (1)... View MoreTypearticle (1)Source Title
Optics Express (1)
xmlui.ArtifactBrowser.AdvancedSearch.type_publisherOptical Society of America (1)Rights Access
openAccess (1)